shafaqat.ali@numl.edu.pk
(051)-9265100, Ext: 2320
1. Lecturer (Statistics), Department of Mathematics,
National University of Modern Languages, Islamabad (2023 - date)
2. Permanent Lecturer (Statistics), Department of Mathematics,
Ripha International University, Faisalabad Campus (2022-2023)
3. Visiting lecturer Department of Mathematics and Statistics,
University of Agriculture, Faisalabad, Main campus (2019-2023)
4. Visiting Lecturer, Department of Statistics,
Government College University, Faisalabad (2018-2023).
5. Lecturer in Statistics, GPCSF, Faisalabad
1. Ali, S., Khoo, M. B. C., Kashif, M., Javed, Z., & Saha, S. (2022). Constructing Bootstrap Confidence Intervals of Process Capability Indices for a Three Parameter Weibull Distribution. MATEMATIKA: Malaysian Journal of Industrial and Applied Mathematics, 21-32.
2. Ali, S., Ali, S., Shah, I., Siddiqui, G. F., Saba, T., & Rehman, A. (2020). Reliability analysis for electronic devices using generalized exponential distribution. IEEE
Access, 8, 108629-108644.
3. Ali, S., Ali, S., Shah, I., & Khajavi, A. N. (2019). Reliability analysis for electronic devices using beta generalized weibull distribution. Iranian Journal of Science and Technology, Transactions A: Science, 43, 2501-2514.
https://scholar.google.com/citations?user=FY1zEn8AAAAJ&hl=en
https://www.researchgate.net/profile/Shafaqat-Ali-6
Reliability Analysis,
Statistical process control,
and probability distributions.
1. Lecturer (Statistics), Department of Mathematics,
National University of Modern Languages, Islamabad (2023 - date)
2. Permanent Lecturer (Statistics), Department of Mathematics,
Ripha International University, Faisalabad Campus (2022-2023)
3. Visiting lecturer Department of Mathematics and Statistics,
University of Agriculture, Faisalabad, Main campus (2019-2023)
4. Visiting Lecturer, Department of Statistics,
Government College University, Faisalabad (2018-2023).
5. Lecturer in Statistics, GPCSF, Faisalabad
1. Ali, S., Khoo, M. B. C., Kashif, M., Javed, Z., & Saha, S. (2022). Constructing Bootstrap Confidence Intervals of Process Capability Indices for a Three Parameter Weibull Distribution. MATEMATIKA: Malaysian Journal of Industrial and Applied Mathematics, 21-32.
2. Ali, S., Ali, S., Shah, I., Siddiqui, G. F., Saba, T., & Rehman, A. (2020). Reliability analysis for electronic devices using generalized exponential distribution. IEEE
Access, 8, 108629-108644.
3. Ali, S., Ali, S., Shah, I., & Khajavi, A. N. (2019). Reliability analysis for electronic devices using beta generalized weibull distribution. Iranian Journal of Science and Technology, Transactions A: Science, 43, 2501-2514.
https://scholar.google.com/citations?user=FY1zEn8AAAAJ&hl=en
https://www.researchgate.net/profile/Shafaqat-Ali-6
Reliability Analysis,
Statistical process control,
and probability distributions.